Large-scale simulations have been performed on the current-driventwo-dimensional XY gauge glass model with resistively-shunted-junctiondynamics. It is observed that the linear resistivity at low temperatures tendsto zero, providing strong evidence of glass transition at finite temperature.Dynamic scaling analysis demonstrates that perfect collapses of current-voltagedata can be achieved with the glass transition temperature $T_{g}=0.22$, thecorrelation length critical exponent $\nu =1.8$, and the dynamic criticalexponent $ z=2.0$. A genuine continuous depinning transition is found at zerotemperature. For creeping at low temperatures, critical exponents are evaluatedand a non-Arrhenius creep motion is observed in the glass phase.
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机译：在具有电阻分流结动力学的电流驱动二维XY量规玻璃模型上进行了大规模仿真。观察到低温下的线性电阻率趋于零，从而提供了在有限温度下玻璃化转变的有力证据。动态定标分析表明，在玻璃化转变温度$ T_ {g} = 0.22 $的情况下，电流-电压数据可以完全崩溃。 ，相关长度临界指数$ \ nu = 1.8 $和动态临界指数$ z = 2.0 $。在零温度下发现真正的连续脱钉转变。对于在低温下蠕变，评估了关键指数，并且在玻璃相中观察到非阿伦尼乌斯蠕变运动。
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